Atomic force microscopies
Responsible : Gilles Pecastaings
Contact : plateforme@crpp.cnrs.fr – +33 5 56 84 30 30
Our Platform is equipped with 3 high resolution systems: 1 STM (Tunnel Effect Microscope) and 2 AFM (Atomic Force Microscopes), Dimension ICON and Multimode 8, from Bruker Corporation
Applications and features
High resolution 3D surface imaging (lateral resolution from a few nanometers to a few tens of microns, and up to 10 micrometers in z). Samples of small and large sizes (a few tens of mm2 to a few hundred cm2 for a maximum thickness of 12 cm).
Local measurements (forces, adhesion, electrical conductivity, piezoelectricity, hardness, tunnel spectroscopy, etc.).
Measurements in air, in a controlled atmosphere and in aqueous solution. Temperature measurements possible (between -5 ° C and 100 ° C).